page 1
page 2
page 3
page 4
page 5
page 6
page 7
page 8
page 9
page 10
page 11
page 12
page 13
page 14
page 15
page 16
page 17
page 18
page 19
page 20
page 21
page 22
page 23
page 24
page 25
page 26
page 27
page 28
page 29
page 30
page 31
page 32
page 33
page 34
page 35
page 36

Think you've seen Themis? Meet Z. We're making it easier to analyze low-Z, beam sensitive materials that are typically difficult to image in STEM mode. Discover how the FEI Themis Z can help you explore the widest range of materials across the periodic table. Discover more at FEI.com/Themis-Z

Operating at over 3,000 indexed patterns per second, Symmetry® balances unprecedented speed with exceptional sensitivity to enable work even at low beam currents and voltages. • CMOS speed: 3000 patterns per second• CMOS sensitivity: ideal for all analyses • 1244 x 1024 resolution - ideal for High Resolution (HR) EBSD• No compromise: one detector for all applicationsIntroducing the world's first CMOS-based EBSD Detector For a demo, or to attend our EDS & EBSD workshops for insights into the innovative technologies we're launching in 2017, please visit www.oxinst.com/mm2017SYMMETRYNi Superalloy: data acquired at 3000 patterns per second. See the Symmetry story, videos and application notes: www.oxinst.com/cmos-ebsd