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CIRCLE NO. 3 OR ONLINE: www.microscopy-analysis.com

Optical Properties at the Nanoscale MonoCL 4T High Resolution Cathodoluminescence Imaging and Spectroscopy5 ?m1 ?m2 ?mANALYTICAL TEMDIGITAL IMAGINGSPECIMEN PREPARATIONTEM SPECIMEN HOLDERSSEM PRODUCTSSOFTWAREX-RAY MICROSCOPYwww.gatan.comTop left: Dislocations and growth zonation revealed in free standing GaN wafer by panchromatic imaging.Top right: Surface plasmon resonance modes along vertices and at apex of pyramid structures revealed using monochromatic imaging. Pyramids formed by 200nm Au film deposited on patterned substrate. Overlay of secondary electron image (grey) and, 650nm (green) and 750nm (red) monochromatic images. Bottom left: Irregularity in emission of GaAs nanowires.  In-lens secondary electron image overlaid with panchromatic CL image (green); images acquired simultaneously.Bottom right: Four AlGaN concentrations revealed in graded AlxGa1-xN on GaN film using spectrum-linescan of sample cross section. Blue shift in spectrum from 365 to 320nm associated with change in Al fraction. Spectra acquired at rate of 20 spectra/s.