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Fold hereFold hereREGISTER AND ENQUIRE ELECTRONICALLYVisit our website:www.microscopy-analysis.comONLY USE THIS CARD FOR ENQUIRIES FORUK/EUROPEAN MICROSCOPY AND ANALYSIS NOVEMBER/DECEMBER 2011ENQUIRIES FOR MAGAZINECircle enquiry numbers for information 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60ENQUIRIES FOR BUYER'S GUIDECircle enquiry numbers for information L00 L01 L02 L03 L04 L05 L06 L07 L08 L09 L10 L11 L12 L13 L14 L15 L16 L17 L18 L19 L20 L21 L22 L23 L24 L30 L31 L32 L33 L34 L35 L36 L37 L38 L39 L40 L41 L42 L43 L44 L45 L46 M00 M01 M02 M03 M04 M05 M10 M11 M12 M13 M14 M15 E00 E01 E02 E03 E04 E05 E06 E07 E08 E09 E10 E11 E12 E13 E14 E15 E16 E17 E18 E19 E20 E21 E22 E23 E30 E31 E32 E33 E34 E35 E36 E37 E38 E39 E40 E41 E42 E43 C00 C01 C02 C03 C04 C05 C06 C07 C08 C09 C10 D00 D01 D02 D03 D04 D05 D06 D07 D08 D09 D10 D11 D12 D13 D14 D15 P00 P01 P02 P03 P04 P05 F00 F01 F02 F03 F04 F05 F06 F07 F08 F09 F10 F11 F12 F13 F14 F15 F16 F17 F18 F19 F20 F21 F22 F23 F24 F25 F26 F27 F28 F29 F30 G00 G01 G02 G03 G04 G05 G06 G07 G08 G09 H00 H01 H02 H03 Please use this box to complete any comments for the magazine or additional enquiriesMicroscopy & AnalysisReader ServicesJohn Wiley & Sons, LtdThe AtriumSouthern GateChichesterWest SussexPO19 8SQUnited KingdomAffixStampHereSEAL HEREDO NOT USE STAPLES

Learn more at www.fei.com/researchView, Analyze, & Create in 3Dwith the most powerful FIB and SEMAustenic-ferritic duplex steel, 16 x 12 x 18 ?m3 volume acquired with the AutoSlice and ViewT application. A series of top-down high energy, high angle SEM-BSE images were collected automatically. The distance between each slice is 30 nm. Courtesy of FEI NanoPort.Surface of uncoated pollen, imaged using SEM at very low kV (50 V). The horizontal field width is 51 ?m. Courtesy of FEI NanoPort.. Ultra-stable, contamination and damage free imaging of uncoated charging or beam-sensitive samples. Best in class sample preparation: precise milling of large volume, very low kV polishing, process monitoring. Most complete and integrated suite of prototyping capabilities with SEM, FIB and beam chemistries. Robust, reproducible and versatile multi-signal 3D Slice and View automation. Accurate and flexible sample positioning and handling. Outstanding application and service supportPlatinum nanowire deposited and milled to about 50 nm diameter for use as a gas sensorCourtesy of Peter Heard, Bristol University, United Kingdom.Helios NanoLabT 50 SeriesLearn more at www.fei.com/researchView, Analyze, & Create in 3Dwith the most powerful FIB and SEMAustenic-ferritic duplex steel, 16 x 12 x 18 ?m3 volume acquired with the AutoSlice and ViewT application. A series of top-down high energy, high angle SEM-BSE images were collected automatically. The distance between each slice is 30 nm. Courtesy of FEI NanoPort.Surface of uncoated pollen, imaged using SEM at very low kV (50 V). The horizontal field width is 51 ?m. Courtesy of FEI NanoPort.. Ultra-stable, contamination and damage free imaging of uncoated charging or beam-sensitive samples. Best in class sample preparation: precise milling of large volume, very low kV polishing, process monitoring. Most complete and integrated suite of prototyping capabilities with SEM, FIB and beam chemistries. Robust, reproducible and versatile multi-signal 3D Slice and View automation. Accurate and flexible sample positioning and handling. Outstanding application and service supportPlatinum nanowire deposited and milled to about 50 nm diameter for use as a gas sensorCourtesy of Peter Heard, Bristol University, United Kingdom.Helios NanoLabT 50 SeriesCIRCLE NO. 38 OR ONLINE: www.microscopy-analysis.com