page 1
page 2
page 3
page 4
page 5
page 6
page 7
page 8
page 9
page 10
page 11
page 12
page 13
page 14
page 15
page 16
page 17
page 18
page 19
page 20
page 21
page 22
page 23
page 24
page 25
page 26
page 27
page 28
page 29
page 30
page 31
page 32
page 33
page 34
page 35
page 36
page 37
page 38
page 39
page 40
page 41
page 42
page 43
page 44

ADVERTISERS INDEXPageCompany NameReader EnqMICROSCOPY AND ANALYSIS 40NOVEMBER 2011For LM, SPM, EM, Bold entries are the standard types of instruments; other entries arethe modes in which they are used. Use this also for web page cross referencing.AND ANALYSISC00COMPOSITIONAL ANALYSIS­C02Calibration devices and standardsC03CathodoluminescenceC04Electron backscatter diffraction(EBSD)C05Electron beam induced current(EBIC)C06Electron diffraction, convergentbeam electron diffraction (ED,CBED)C07Electron energy loss spectroscopy,electron spectroscopic imaging(EELS, ESI)C08Energy and wavelengthdispersive X-ray spectroscopy(EDX, WDX)C09Mass spectrometry (MS, SIMS)C10X-ray diffraction, X-ray fluorescence,X-ray photoelectron spectroscopy(XRD, XRF, XPS)D00DIGITAL IMAGING ANDANALYSISD01CCD camerasD02CMOS camerasD04Frame grabbersD05Image analysis hardwareD06Image analysis softwareD07Image archiving and reportingD09Image intensifiersD10Machine vision systemsD11MetrologyD12Particle countingD13Stereoscopic displayD14Video camerasD15Video processorsP00PHOTOGRAPHIC EQUIPMENTAND SUPPLIESP01Chemicals, film and paperF00SPECIMEN PREPARATIONEQUIPMENT AND SUPPLIESF01Coating unitsF02Critical point dryersF03Cryofixation and cryosubstitutiondevicesF05CryostatsF07Cutting, grinding, polishing andthinning devicesF08Cytochemical, immunochemicaland in-situ probesF09Electrolytic thinningF11Fixatives, stains and chemicalsF12Freeze drying equipmentF13Freeze etch and fracture unitsF14Glass/steel/diamond knivesF15Gold probesF16Grids F17Histology equipment and suppliesF18Ion beam etching and thinningF19Ion beam millingF20Ion beam sputter coatingF21KnifemakersF22MicrotomesF23Microwave processingF24Plasma cleaningF25Plasma etchingF26Reactive ion beam etchingF27Section stainersF28Tissue processorsF29UltramicrotomesF30VibratomesG00GENERAL MICROSCOPY EQUIPMENT,SUPPLIES AND SERVICESG01Anti-vibration systemsG04Image analysis serviceG05Maintenance contracts and servicingG06Microhardness and failure testingG07Thermal analysisG08TrainingG09Used equipmentG10Workshops for microscopistsH00SOCIETIESH01CONFERENCES, COURSES, ANDEXHIBITIONSH03RECRUITMENT SERVICESBUYER'S GUIDEwww. microscopy-analysis.comL00LIGHT MICROSCOPYL01Transmitted light microscopesL02Reflected light microscopesL03Stereomicroscopes L04AcousticL05Confocal L06Differential interference contrastL08Field and mobile microscopesL10Fluorescence lifetimeL11Fluorescence resonanceenergy transferL12Fluorescence spectroscopyL13High resolution imaging (4Pi, STED)L14InfraredL15InterferenceL16Modulation contrastL17MultiphotonL18Multispectral imaging L19Phase contrastL20PolarizationL21Profilometry and metrologyL22RamanL23Total internal reflection fluorescenceL24UltravioletL30LM ACCESSORIES AND SUPPLIESL31Autofocusing devicesL32Calibration devices and standardsL33CondensersL35Environmental chambersL36EyepiecesL37Filters, beamsplitters, polarizersL38Lamps, IlluminatorsL39Lasers, LEDsL40Micromanipulators andmicroinjectorsL41ObjectivesL42OpticsL43Scanning headsL44StagesL45StandsE00ELECTRON, ION AND X-RAYMICROSCOPESE01Transmission electron microscopesE02Scanning electron microscopesE03Ion beam microscopesE05X-ray microscopesE07Analytical TEME08Atom probesE09Auger microscopesE10Cryoelectron microscopesE11Dual beam microscopesE12Energy filtering TEME13Environmental and variablepressure SEME14Helium ion microscopesE15High and intermediate voltageelectron microscopesE17Low energy electron microscopesE18MicroprobesE19Nanofabrication,nanolithographyE21Secondary ion microscopesE22TomographyE23 X-ray microtomographyE30EM ACCESSORIES AND SUPPLIESE32Anti-contamination systemsE33Anti-vibration systemsE34Apertures and filamentsE35Calibration standardsE36Cryotransfer systemsE37Energy filtersE38Magnetic field cancellationE39Specimen holders for TEME40Spectrometers (EDX, WDX, EELS)E41Stages for SEME42Vacuum equipmentE44Plasma cleanersE45Anti-contaminatorsM00SCANNING PROBE MICROSCOPESM01Scanning tunnelling microscopes M02Atomic force microscopes M03Nearfield scanning optical microscopesM04Specialized SPMsM05Dual mode (LM/SEM/TEM) SPMsM06SPM NanolithographyM10SPM ACCESSORIES AND SUPPLIESM11Calibration devices and standardsM12Cantilevers M13ScannersM14StagesM15TipsCIRCLENO. 37 ORONLINE: www.microscopy-analysis.comS2Agilent128Andor516APMC 2012835Applied Scientific Instrumentation325Asylum Research3S15Bruker GmbH1731Bruker GmbH2832Bruker Nano2930Cargille27S9E2V14S1FEI Company1128FEI Company2643FEI Company386Gatan425Herzan4035Hiden3314Hitachi Europe GmbH7S4Hitachi Europe GmbH613Jeol UK16S10Jeol UK16S9John Wiley & Sons Ltd.1524John Wiley & Sons Ltd.2440John Wiley & Sons Ltd.3738JPK Instruments3518Leica927Leica25S22Märzhäuser WetzlarGmbH20S31NT-MDT221Olympus Europa Holding GmbH12Olympus Europa Holding GmbH220Olympus Soft Imaging Solutions GmbH10S16Oxford Instruments1834Physik Instrumente3133Picoquant3037Prior Scientific3437Quorum Technologies4039Schaefer-Tec3644Skyscan39S18Thermo Scientific19S22XEI Scientific, Inc.21S32Carl Zeiss23

RESPONSIBILITYApprove equipmentSpecify equipmentPurchase equipmentNone of the aboveAND ANALYSISREGISTER AND ENQUIREELECTRONICALLYVisit our website: www.microscopy-analysis.comPlease register me as a NEW READERPlease RE-REGISTER meMy USER NO is (see address label)TitleProf Dr Ing Mr Ms Mrs(please indicate)OtherFirst NamesLast NamesJob TitleOrganisation NameDepartment NameOrganisation AddressPlease supply your full postal addressremembering to include any Room Numbers,Post Box numbers or Mail Stop Codes.We do not register home addresses.CityStateCountryPostal CodeTelephone NumberFax NumberEmail Address** We regret that we are no longer able to accept paper registrations without an email address.We periodically send registered readers e-newsletters about the content in the magazine as an aditional free informationresource. If you do NOT wish us to email you please check this box.Light Microscopy11 Transmitted/Reflection12 Stereo14 Confocal15 Multi Photon16 Fluorescence18 Polarised60 Digital/Slide ScannersElectron Microscopy20 TEM21 STEM22 SEM24 FIB25 Cryo EM61 EFTEM62 VPSEM63 Ion/Atom Probe/X-RayCompositional Analysis26 EELS33/34 EDX/WDX35 ED/CBED36 EBSD38 XRD39 XRF41 AES42 SIMS44 FTIR45 Raman64 CathodoluminescenceScanning Probe Microscopy28 STM29 AFM30 NSOM / SNOMColleague/FriendConference/ExhibitionNewswire SubscriptionOnline advertOther websitePress advertSearch EngineOtherHOW DID YOU FIND USWe may wish to send you emails from selected third-parties. If you would like to receive these emails please check this boxTO REGISTER OR RE-REGISTERplease fill in ALL sections on this page.TO SUBMIT PRODUCT ENQUIRIES please fill in your Name and Email details. INDUSTRIAL SECTORTECHNIQUEEducation: UniversityEnvironmental ServicesGovernmentManufacturingMedical and Health ServicesResearch and DevelopmentProfessor/LecturerPostDoc/GraduateResearch OfficerScientist/EngineerTechnicianForensicsMilitarySales/Corporate RoleLibrarianJOB ROLESPECIALTYEarth SciencesElectronicsEnvironmentFood TechnologyLife SciencesMachine VisionMaterials ScienceMedical TechnologyQuality ControlSemiconductorsMAIN INTERESTSLight MicroscopyElectron Ion andXRay MicroscopyScanning Probe Microscopy