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MICROSCOPY AND ANALYSIS 38NOVEMBER 2011CIRCLENO. 35 ORONLINE: www.microscopy-analysis.comWeb Microscopy 2.0We live in the midst of Web 2.0 and Cloud computingrevolution. Today you can store documents, imagesand music on the Cloud and access them from anyweb browser; you can share data instantly and col-laborate in real time. If we can do so many thingsonline, why not image analysis? With proliferation ofhigh-speed internet and digital imaging, may be it istime to bring web 2.0 technology to microscopy? One aspiring technology startup thinks so: SmartImaging Technologies, a VC-backed technology ven-ture from Texas, pledges to bring Web 2.0 technologyto microscopy with Simagis Live cloud software. "Wewant to bring power and convenience of web appli-cations to microscopy and microanalysis, and makeweb technology available to millions of microscopeusers around the globe. If you have digital cameraand Internet- you are ready for Web Microscopy,"says company founder Vitali Khvatkov.With Web Microscopy, a small software utility onyour desktop will automatically upload your digitalimages to a cloud server so you can work with themonline via a web interface. If you have automatedmicroscope stage, you can stream individual image200kVTransmissionElectronMicroscopeA new 200 kV transmission electron microscope fromJEOL delivers high throughput nano-analysis forprocess and quality control of mass produced semi-conductor and materials samples. The multi-functionJEOL JEM-2800 features high resolution imaging inTEM, STEM, and SE modes; ultrasensitive elementalmapping with a large angle Energy Dispersive Spec-trometer (EDS); Electron Energy Loss Spectroscopy(EELS) for chemical analysis; critical dimension analy-sis; tomography; and in situ observation of samples.The all-new TEM functions without use of the tradi-tional fluorescent screen on the electron column. The JEM-2800 speeds specimen observationthrough fully automatic functions including adjust-ment of focus, astigmatism, contrast, brightness, crys-tal zone axis alignment, and height. Switchingbetween analysis modes is seamless, and quick datacollection shortens turnaround time between sam-ples. An operator navigation system and on-screenoperating guide make the JEM-2800 a high through-put, user-friendly TEM for any skill level. Additional features and key specifications of theJEM-2800 include a Schottky field-emission electrongun, highly stable eucentric side-entry goniometerstage, a magnification range of 100??toWidefield Superresolution MicroscopeWith the new Leica SR GSD from LeicaMicrosystems, scientists can now achieve res-olutions far below the limit of diffraction thathave never been attained before in widefieldfluorescence microscopy. The system is capa-ble of resolving details as small as 20 nm. The SR GSD is based on GSDIM (groundstate depletion followed by individual mole-cule return) technology exclusively licensedfrom MPI Goettingen. It has already delivered amaz-ing results in scientific experiments during its testphase. One of the key advantages of the GSDIMmethod is that it can be used with conventional fluo-rescence labels routinely applied in fluorescenceimaging applications. GSDIM provides the highest res-olution possible with a light microscope today, almostequalling that of an electron microscope.The Leica SR GSD is based on a fully automated TIRF150,000,000??using STEM, 0.1 nm TEM resolution and0.20 nm BF/DF STEM resolution.The JEM-2800 is JEOL's latest addition to its com-prehensive lineup of 100-300kV TEMs and mostrecently the ARM200F atomic resolution TEM. Thefirst US customer, a global semiconductor manufac-turer, will take delivery of the new JEM-2800 withlarge solid angle EDS this summer. Contact: JEOL USA, Inc. www.jeolusa.comtiles to the server for stitching and creating mosaicimages or virtual slides, to view your entire specimenat full resolution online. Once your digital images orvirtual slides are uploaded, they can be viewed, anno-tated and measured by any number of people at thesame time from any computer or web tablet. You canupload composite images with several fluorescencechannels and view them online with overlays. Web Viewers utilize zoom technology similar toGoogle Maps and allow panning and zooming on vir-tual slides of unlimited size. Contact: Smart Imaging Technologies Combining the benefits of super-resolutionwith TIRF microscopy is one of many options. The sys-tem can also be used for a wide range of applicationsin all areas of live cell microscopy and high-end fluo-rescence microscopy. As a flexible, multifunctional sys-tem, the Leica SR GSD gives researchers the freedomto tailor the system exactly to their needs.Contact: Leica Microsystems

MICROSCOPY AND ANALYSIS NOVEMBER 201139WHAT'SNEWCIRCLENO. 36 ORONLINE: www.microscopy-analysis.comBruker has introduced the XFlash 5060 T, thelatest addition to the XFlash family of detec-tors for X-ray micro- and nanoanalysis (EDS) inelectron microscopy. The XFlash 5060 T is oneof two detectors available for use on (scan-ning) transmission electron microscopes. Pro-viding 60 mm² active area, it guarantees opti-mum solid angle for the analysis at low beamcurrents and of samples with low X-ray yield.The slender detector end cap and microscope-specific collimator design allow shortestdetector-sample distances and provide a hightake-off angle without requiring sample tilt. Compared to Si(Li) detectors, still commonly usedfor EDS on TEM, the XFlash 5060 T exhibits superiorspeed and drastically lower dead times, providing sig-nificant advantages in collection efficiency, even inlow count rate situations. Additionally, the XFlash5060 T can operate with good energy resolution atcount rates far beyond what any Si(Li) or even com-peting SDD can handle on TEM. The detector is fullyoperational at input count rates of up to 750,000 cps,a big advantage for low-mag high count rate STEMmapping. Also, there is no danger of 'locking up' thespectrometer for minutes when hitting a supportgrid.The superb sensitivity of the XFlash 5060 T allowsdetection of high energy radiation. In combinationwith high-end signal processing electronics andsophisticated software, reliable quantitative analysisof element peaks at 40 kV and above is possible.Large Area EDS Detector for S/TEMBruker's many years of experience in SDD and signalprocessing electronics design, have led to the out-standing energy resolution of the XFlash 5060 T atonly moderate cooling temperatures, enabling reli-able and efficient light element analysis of elementsdown to boron.The XFlash 5060 T, including electronics, is designedto cause minimum interference with all compatibletransmission electron microscopes, conventional oraberration-corrected. Light-weight and with passivecooling, this detector causes minimal strain on the col-umn and introduces no vibrations. The low tempera-ture gradient provides stable measurement condi-tions and the completely non-magnetic detectorhead minimizes beam shift, when moving the detec-tor in or out during TEM operation.Contact: Bruker Nano GmbH www.bruker-nano.comChemical Analysis in the S/TEMFEI, a leading instrumentation company providingelectron microscope systems for applications inresearch and industry, has announced the release ofits Titan G2 80-200 with ChemiSTEM technology, anew member of the Titan G2 series of S/TEM (scan-ning / transmission electron microscopes). "By combining the Titan platform's latest genera-tion of electron optics with the revolutionary analyt-ical sensitivity of ChemiSTEM Technology, we havecreated a microscope which can deliver atomic reso-lution elemental maps in minutes and adds new capa-bilities in addressing our customer's applications inmaterials science, chemistry and nanotechnology,"said Trisha Rice, vice president and general managerof FEI's Research Business Unit.Dr Paul Kotula of Sandia National Laboratories,said: "Our institute chose the FEI Titan G2 80-200 dueto its innovative combination of the latest in probe-correction technology and large solid-angle, win-dowless silicon-drift X-ray detectors (SDDs). We esti-GaAs Atomic EDX in the [110] crystal projection showing 1.4 Angstroms Ga-As dumbbells obtained with Titan G2 80-200 with ChemiSTEM technology. TheGaAs [110] dumbbell splitting of 0.14 nm is clearly resolved by chemical mapping using energy dispersive X-ray analysis with a Titan G2 80-200 with ChemiS-TEM technology and a probe Cs-corrector at 200 kV acceleration voltage, using a 200 pA probe current. On the right hand side the atomic structure of GaAsthe [110] projection is shown along with the grayscale HAADF-STEM image. This represents the highest resolution ever obtained in atomic elemental mappingby any technique using an S/TEM.mate that we willgain a factor of 50 to100 in terms of ana-lytical sensitivity,speed, and spatialresolution com-bined, over our exist-ing FEG analyticalelectron microscope.It is already clear thatatomic resolution X-ray microanalysis is not only possible but practicalwith this new microscope. Once the domain only ofelectron energy loss spectrometry, atomic resolutionmicroanalysis with x-rays gives us access to more ofthe periodic table and the possibility to use existingquantification methods to routinely analyze manymaterials at the highest resolution and sensitivityneeded." Contact: FEI ????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????Contact your nearest officeGermany +49 6103 300 980France +33 1 6449 6350South-East Europe +39 0425 460 218Switzerland +41 34 423 7070www.schaefer-tec.comSensofar Plu neox for research and industry???? Confocal and Interferometer modes in the same instrument???? Color CCD camera???? White and blue LED light sources???? Vertical resolution down to 0.01 nm???? Lateral resolution down to 140 nmWe also supplyAFMs for research, industry and teachingNano-/Micro- Indenter and Tribology Tester,Nanoparticle size measurement, LEED/AES