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MICROSCOPY AND ANALYSIS 36NOVEMBER 2011Boeckeler RMC Productsrecently celebrated thesuccessful launch of itsnew environmentalchamber for ultramicro-tomy during a trainingdemonstration at theSociété Française Mu(SFmu) 2011 conferenceheld in Strasbourg,France last June. Accord-ing to Boeckeler President Pat Brey, the demonstration included an impressivearray of sectioning methods including sectioning for low voltage TEM (transmissionelectron microscopy), Tokuyasu immunolabeling and CEMOVIS (cryo-electronmicroscopy of vitreous sections) sectioning. The environmental chamber was critical to creating the parameters necessary forproducing a continuous ribbon of 25 sections of a frozen hydrated sample 50 nmthick that had been flash frozen under high pressure. Such high-pressure freezingof biological specimens retains as much cell structure as possible for viewing underan electron microscope. The CEMOVIS method of sample preparation is experi-encing resurgence in popularity among cell biologists since it was introduced in the1980s, due in part to advances in overcoming some of the difficulties first encoun-tered in the method. "These tiny ribbons are so thin, they could be free-floating," Mr Brey says. "So,that means that the environment around the RMC ultramicrotome had to be espe-cially free of air movement and static charges, which the chamber and ionizer suc-cessfully provided." The work was performed on samples frozen in the lab of Daniele Spehner fromthe Institute of Genetics and Molecular and Cellular Biology. Colleague CarolineKizilyaprak from Bruno Humbel's lab at the University of Lausanne, and GregBecker of RMC performed the sample trimming and sectioning, using a Diatome35-degree diamond knife. Contact: Boeckeler Instruments Inc. Environmental Cryo ChamberCEMOVIS 50 nm serial sections of yeast cut on an RMC PT-PC systemThe new phoenix x|aminer from GE's Inspection Technologies business is a 5-axis,microfocus X-ray inspection system, which has been developed for quality controlapplications in the manufacture of electronics sub-assemblies. It is particularly suit-able for the reliable and accurate inspection of soldered joints. The phoenixx|aminer features two megapixel high resolution and high magnification. In addi-tion, its powerful imaging software permits intuitive programming and compo-nent manipulation is precise and easy using a computer mouse or joystick. An important design feature of the new system is its OVHM (oblique view highmagnification) module, which allows an oblique angle view of up to 70° as well asa total magnification of up to >23,000??. This ensures best possible quality of defectinformation in the vertical direction. Ease of maintenance is also permitted with thesystem's open, 160 kV microfocus tube design, whose easy cathode replacementensures unlimited operating life, while its 20 W of tube power at target can pene-trate even the most radiation-absorbing components. The new x|aminer is suppliedwith the recently launched phoenix x|act software, which is designed specially forelectronics inspection. Contact: GE Energy Services X-Ray Inspection SolutionBackscatter DiffractionOxford Instruments NanoAnalysis, a world leader in microanalysis systems,launched a new EBSD detector at M&M 2011 in Nashville. The new NordlysNanoaddresses the growing requirements of nanoscale applications: it is 60% more sen-sitive than the previous generation of EBSD detector, the NordlysS. Increased sensitivity offers a number of benefits. Firstly, accurate EBSD data canbe collected at lower beam energy, including low beam currents (<0.1 nA) and lowkV. Using lower energy beams is essential for applications where spatial resolutionis required, for example nanoscale applications. It is also important when lookingat beam sensitive samples, or non-conducting samples. In addition, increased sen-sitivity enables faster data acquisition under comparable beam conditions. According to EBSD Business Manager, Dr Jenny Goulden, "As a business, OxfordInstruments aims to use innovation to turn smart science into world class productsthat delight our customers, and the NordlysNano is a classic example of achievingjust that!" The new NordlysNano EBSD detector is 60% more sensitive than its pre-decessor, the NordlysS. It enables faster and higher resolution analysis of a crystal structure.Contact: Oxford Instruments www.oxford-instruments.comHitachi High-Technologies has launched the IM4000 Ion Milling system. Used toprepare specimens for scanning electron microscope (SEM) imaging and analyticalstudies such as EDX and EBSP, the versatile IM4000 is capable of both pin-pointcross-section and flat surface ion milling. Cross-section milling provides smooth cross-section specimens for high resolutionimaging of subsurface structures, with the cross-section position accurately con-trollable by fine positioning of a beam-shielding mask edge. Flat milling providesuniform polishing of surfaces of 5 mm in diameter or more with variable anglemilling, to either flatten surfaces or to selectively enhance specimen surface fea-tures (relief milling). The two IM4000 applications -cross-section and flat surfacemilling -are realised via two different removable sample stage units, allowing forconvenient specimen setting and cutting edge definition using an external opticalmicroscope.The IM4000 ion milling system features a new high-current argon ion gun thatdelivers cross-sectional milling rates of 300 um/hr in silicon for dramatically reducedcross-sectioning times. The wide Argon ion beam can define sharp cross sectionseven on samples of dissimilar materials with different hardness that can not be cutor broken without causing material deformations or dislocations. Sensitive mate-rials like polymers or papers can be processed by freely selecting proper lower ionbeam energies between 0 and 6 kV, without need for special sample cooling. Wide and smooth flat milled surfaces of approximately 5mm in diameter ormore can be achieved within minutes by shifting the centre of the defocused ionbeam from the sample rotation or swinging centre. The beam irradiation angle tothe specimen surface is selectable from 0 to 90 degrees. Contact: Hitachi High-Technologies Corporation www.hht-eu.comArgon Ion Milling System

MICROSCOPY AND ANALYSIS NOVEMBER 201137CIRCLE NO. 40 OR ONLINE: www.microscopy-analysis.comQuorum TechnologiesQuorumTomorrow's EM coatingtechnology today . . .> Fully automatic, touch screen control> Turbo or rotary pumped> Sputtering or carbon evaporation> Large specimen capability (wafers) > Dual head version (for sequential coating)> Glow discharge, FTM and other options> Three year warrantyQuorum Technologies+44 (0)1233 646332www.quorumtech.comQuorum Q series NEWQ300IntroducingLumenLED.Focussed on microscopySuperior stability is just one of theadvantages of LumenLED, an advancedillumination system for fluorescencemicroscopy. Thanks to a closed-loopoptical feedback mechanism, LEDintensity is continuously monitored toensure constant illumination over hours,days and even longer! It also ensuresreproducibility from one experiment tothe next. For stability, fast switching timesand ease of use choose LumenLED!For further information visit the web or email a brochurerequest to uksales@prior.comPrior Scientific InstrumentsCambridge CB21 5ET UKTelephone +44 (0)1223 881711www.prior.comPrior_LumenLED_M&A_AD264x92_Layout 1 28/06/2011 09:24 Page 1CIRCLE NO. 34 OR ONLINE: