page 1
page 2
page 3
page 4
page 5
page 6
page 7
page 8
page 9
page 10
page 11
page 12
page 13
page 14
page 15
page 16
page 17
page 18
page 19
page 20
page 21
page 22
page 23
page 24
page 25
page 26
page 27
page 28
page 29
page 30
page 31
page 32
page 33
page 34
page 35
page 36
page 37
page 38
page 39
page 40
page 41
page 42
page 43
page 44

MICROSCOPY AND ANALYSIS 34NOVEMBER 2011Hitachi High-Technologies has launched the SU8000 family of ultrahigh-resolutionfield-emission scanning electron microscopes (FESEMs) for investigating the finesurface structure of materials in a wide range of nanotechnology fields. The newSU8000 series features a common, high performance electron optical platform toprovide excellent imaging performance, and offers a variety of stages, chambersand signal detection systems. The new SU8010, SU8020 and SU8030 join the existing SU8040 to form this com-prehensive family of ultrahigh-resolution microscopes. A high-brightness cold cath-ode field-emission source is used in combination with the latest generation ofHitachi's patented super ExB in-lens detection systems for energy filtering, chargesuppression, and contrast control. All microscopes offer excellent imaging perfor-mance at low accelerating voltage to minimize sample damage, and enhancedelectron deceleration technology has improved resolution at ultralow landing volt-ages to just 1.3 nm at 1.0 kV. The SU8010 is the entry level model with dual (upper and lower) secondary elec-tron detectors with secondary and backscattered electron signal mixing capabili-ties for versatile imaging. A three-axis motorized stage is provided as standard,capable of accommodating samples up to 100 mm in diameter.The SU8020 offers the same sample handling capabilities using a 5-axis motor-ized stage as standard but benefits from Hitachi's unique triple detector system toextend the capability to collect secondary electrons and low energy backscatteredelectrons. The SU8030 features a large chamber with large specimen stage for sam-ples up to 150 mm in diameter. Contact: Hitachi High-Technologies Corporation www.hht-eu.comHigh Resolution FE-SEMsPicoQuant GmbH hasannounced the successfulcombination of Pico-Quant's time-resolved con-focal fluorescence micro-scope MicroTime 200 withBruker's BioScope Catalystatomic force microscope.The combination of thesetwo systems enables simul-taneous recordings of AFMand optical images of thesame sample region and makes new investigation schemes in the field of live-cellimaging feasible.The combined setup of the MicroTime 200 and the Bioscope Catalyst is straight-forward without the need of larger modifications of the two systems. The syn-chronized data acquisition enables scientists to analyze, e.g., the impact of proteinchanges on cell shape and structure. It also allows high-resolution imaging bymerging of sub-nm topography with optically encoded functionality as well asinvestigations of inter- and intramolecular distances using force spectroscopy.The Bioscope Catalyst AFM including its sample stage is mounted onto theinverted microscope body of the MicroTime 200, which is configured for objectivescanning. In this way, precise overlay of the confocal volume and the AFM tip canbe realized. Electronic communication between the sample-scanner of the AFMand the data acquisition electronics of the MicroTime 200 enables simultaneousrecordings with the two instruments. Contact: PicoQuant GmbH www.picoquant.comCombined Confocal and AFMCIRCLENO. 31 ORONLINE:

MICROSCOPY AND ANALYSIS NOVEMBER 201135WHAT'SNEWCIRCLENO. 32 ORONLINE: www.microscopy-analysis.comLift-Out Shuttle for TEMJPK Instruments hasexpanded its family ofhigh performanceresearch AFM systemswith the announcementof the availability of theNanoWizard 3 Nano-Optics AFM system.Over the past decade,optical phenomena onthe nanoscale havedeveloped into an excit-ing area of research. Tostudy light on the nanoscale and especially its interaction with matter, researcherslook for methods with nanometer spatial resolution. The combination of lightmicroscopy-derived techniques and scanning probe microscopy is a powerful solu-tion. This so-called near-field optical microscopy delivers optical information fromsample surfaces with sub-wavelength resolution.JPK strongly believes in combining techniques, in particular AFM, with optics.This has opened up a field of new applications including TERS/SERS, tip-enhancedfluorescence, nanomanipulation with light, chemical surface analysis and com-pound detection, metamaterials, developments of optically active componentssuch as dyes, markers, light sources and switches. A large number of user publica-tions underscore the success of this technology approach. Now, JPK introducestheir latest platform for AFM and optics - the NanoWizard3 NanoOptics system.The NanoWizard NanoOptics head comes with excellent physical and opticalaccess to the sample from top and bottom as well as from front and side, evenwhen the head and condenser are in place. Additionally, it has an integrated portfor fiber SNOM applications.The new system is ready for a broad range of applications from nanoscale opti-cal imaging by aperture and scattering-type SNOM to experiments involving inter-actions of light with the sample such as absorption, excitation, nonlinear effectsand quenching; these include aperture fiber SNOM experiments using an inte-grated fiber SNOM port in the NanoOptics head and the tuning fork module. Contact: JPK Instruments AG www.jpk.comNano Optics on AFMWorking with leadingGerman manufacturerof precision manipula-tion products, KleindiekNanotechnik, Agar Sci-entific are pleased tooffer the Lift-Out Shut-tle for the UK and Irishmarkets.In-situ lift-out tech-niques have becomemore reliable methodsfor preparation of samples requiring TEM and atom probe inspection. However,despite their new-found popularity, they remain considerably more expensive thanex-situ lift-out techniques and require lots of valuable time in the focused ionbeam (FIB). Time and cost factors call for a faster, simpler procedure while furtherimproving the reliability of the technique. By combining a precision sub-stage with a microgripper system and their novelSemGlu, Kleindiek have developed a new, fast, easy and efficient tool: The Lift-OutShuttle. This device is small enough to fit through the load lock of most commonelectron microscopes. Mounting the sample and the TEM-grid that has beentreated with a small amount of SemGlu to a single microscope stub puts all thepieces necessary for lift-out in place. The stub is then attached to the four-axis(XYZR) sub-stage. Additionally, the Microgripper is fixed to same mounting plateon which the sub-stage is positioned. In this configuration, the gripper remains sta-tionary above the sub-stage and therefore is always centred in the field-of-view ofthe microscope. The stub containing the sample and grid is positioned under thegripper using the sub-stage.With a minimal amount of practice, a sample can be fixed to a grid in five min-utes or less by gripping the previously cut sample, lifting out of the substrate, mov-ing the stage to the TEM-grid (which has been pre-treated with SEMGLU by simplyapplying some glue to the grid using a needle), and mounting the sample to thegrid by making contact between the two and focussing the e-beam on the contactpoint.Contact: Agar Scientific Limited www.agarscientific.comCIRCLENO. 33 ORONLINE: www.microscopy-analysis.comSURFACECOMPOSITIONANALYSISFORIONMICROSCOPYHiden's EQS and MAXIM SIMS analysers provide:chemical surface compositionanalysis for ion probemicroscopydepth profiling andsurface imaging atthe nano scaleinterface toexisting systemsfor further details of Hiden Analytical products for advanced scienceEQS bolt-on SIMS probe Page 1????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????