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MICROSCOPY AND ANALYSIS NOVEMBER 201133WHAT'SNEWCIRCLENO. 30 ORONLINE: www.microscopy-analysis.comHybrid Light and Electron MicroscopeTopcon Positioning Systems (TPS), a globalleader in precision optical, GPS, and automa-tion systems for geodetic, engineering and con-struction applications, has introduced theAquila hybrid microscope to the North Ameri-can market.The microscope magnifies from 30??in opti-cal mode, to 50,000??as an SEM. This uniquehybrid design provides key advantages thatshould expand the use of SEM technology.Ray O'Connor, TPS president and CEO, said,"The Aquila hybrid scope puts the versatility ofan optical microscope and the power of anscanning electron microscope (SEM) into a sim-ple, portable, and affordable package." Thesimplicity of the Aquila, both in design andfunctionality "creates an instrument with virtu-ally no learning curve," he said. "With an arrayMini-SEMHoldersIn close co-operation with its preferreddevelopment partner Deben, Phenom-World has developed a Temperature Con-trolled Sample Holder to study vacuum-sensitive and vulnerable samples on itsPhenom G2 desktop SEMs. This active sample holder is designed tocontrol the temperature of the samplebetween -25°C and +50°C. With the use ofthe temperature controlled holder, thetemperature of the sample is manipu-lated, therefore the humidity around itcan be controlled. This enables imaging ofmoistures and water containing samplesas well as reducing the effect the electronbeam has on beam sensitive samples. Thisresults in an extended viewing time, with-out noticeable vacuum artifacts. Theholder can be retrofitted to all versions ofthe Phenom G2 system.The improved Fibermetric applicationallows measurements and analysis oncomplicated fiber structures, ranging fromspunbond and electrospun fibers to themelt blown type of fibers. Fibermetric pro-vides accurate size information from microand nano fiber samples. Through furtherautomization of several important fea-tures, the Fibermetric has become evenmore user-friendly and guarantees a fastreturn on investment. The automated fea-tures that have the most effect on this arethe high number of measurements (max.1000 per image), the automated featureand fiber size detection, and the analysisof the data points.Contact: Phenom-World BV www.phenom-world.comof features that make it attractive to both theexperienced and new SEM user, it is the mostversatile and easy-to-use microscope on themarket.""Topcon has a long and respected history inthe optical market," O'Connor said. "Eventhough Aquila is not our typical positioninginstrument, it has incredible application oppor-tunities in several markets TPS already serves -mining, forensics, education, and water man-agement in particular." In addition to the areaspointed out by O'Connor, he noted the instru-ment has practical usage in air and water mon-itoring, metallurgy and metal analysis, materi-als analysis, food industry, quality control andmicro-mechanical systems. Contact: Topcon Positioning Systems, Inc. www.topconsem.com????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????????

MICROSCOPY AND ANALYSIS 34NOVEMBER 2011Hitachi High-Technologies has launched the SU8000 family of ultrahigh-resolutionfield-emission scanning electron microscopes (FESEMs) for investigating the finesurface structure of materials in a wide range of nanotechnology fields. The newSU8000 series features a common, high performance electron optical platform toprovide excellent imaging performance, and offers a variety of stages, chambersand signal detection systems. The new SU8010, SU8020 and SU8030 join the existing SU8040 to form this com-prehensive family of ultrahigh-resolution microscopes. A high-brightness cold cath-ode field-emission source is used in combination with the latest generation ofHitachi's patented super ExB in-lens detection systems for energy filtering, chargesuppression, and contrast control. All microscopes offer excellent imaging perfor-mance at low accelerating voltage to minimize sample damage, and enhancedelectron deceleration technology has improved resolution at ultralow landing volt-ages to just 1.3 nm at 1.0 kV. The SU8010 is the entry level model with dual (upper and lower) secondary elec-tron detectors with secondary and backscattered electron signal mixing capabili-ties for versatile imaging. A three-axis motorized stage is provided as standard,capable of accommodating samples up to 100 mm in diameter.The SU8020 offers the same sample handling capabilities using a 5-axis motor-ized stage as standard but benefits from Hitachi's unique triple detector system toextend the capability to collect secondary electrons and low energy backscatteredelectrons. The SU8030 features a large chamber with large specimen stage for sam-ples up to 150 mm in diameter. Contact: Hitachi High-Technologies Corporation www.hht-eu.comHigh Resolution FE-SEMsPicoQuant GmbH hasannounced the successfulcombination of Pico-Quant's time-resolved con-focal fluorescence micro-scope MicroTime 200 withBruker's BioScope Catalystatomic force microscope.The combination of thesetwo systems enables simul-taneous recordings of AFMand optical images of thesame sample region and makes new investigation schemes in the field of live-cellimaging feasible.The combined setup of the MicroTime 200 and the Bioscope Catalyst is straight-forward without the need of larger modifications of the two systems. The syn-chronized data acquisition enables scientists to analyze, e.g., the impact of proteinchanges on cell shape and structure. It also allows high-resolution imaging bymerging of sub-nm topography with optically encoded functionality as well asinvestigations of inter- and intramolecular distances using force spectroscopy.The Bioscope Catalyst AFM including its sample stage is mounted onto theinverted microscope body of the MicroTime 200, which is configured for objectivescanning. In this way, precise overlay of the confocal volume and the AFM tip canbe realized. Electronic communication between the sample-scanner of the AFMand the data acquisition electronics of the MicroTime 200 enables simultaneousrecordings with the two instruments. Contact: PicoQuant GmbH www.picoquant.comCombined Confocal and AFMCIRCLENO. 31 ORONLINE: www.microscopy-analysis.com