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The Dimension FastScan AFM: SEM like user experience, True 3D nanometrology, and quantitative material property mapping in ambient, fl uid, and controlled environmentsInnovation with IntegrityAtomic Force MicroscopyIn many applications Atomic Force Microscopy (AFM) can provide unique and preferred sample information, however its slow speed and high complexity have often offset these benefi ts in favor of Electron Microscopy. The latest generation of Bruker's AFM, the Dimension FastScanT, enables nanometer resolution imaging, in a fraction of a minute, on a large-sample, fully automatable stage. The included ScanAsystT algorithm provides robust, intuitive, self-optimizing work-fl ow based operation. Combined these two capabilities create a highly productive nano-imaging solution akin to current Scanning Electron Microscopes (SEM).While both techniques provide surface imaging on the nano scale, the insights gained from each technique are also complimentary:. AFM can be performed, at nm-resolution, in ambient and fl uid environments, and typically requires no alterations of the sample surface chemistry prior to imaging. This enables non-destructive sample prep, convenient (multi-) sample loading, easy sample access, and imaging of dynamic sample changes over time.. AFM provides true nano-metrological information in all three sample dimensions. While SEM techniques can provide contrast based on elemental analysis, the latest-generation AFM mode, Bruker's proprietary PeakForce-QNM, provides quantitative nanoscale mapping of surface mechanical properties, such as modulus, adhesion, or dissipation, in addition to the standard topographical informationPlease join us for this focused review of the recent advances of the "other" nanoscale surface imaging technology.DATE: December 7th 4 pm BST, 5 pm CET, 11:00 am EDTPresenting: Dr. Johannes KindtFREEWEBINARREGISTERTODAY!To register for this webinar and for further information, please go to: hhttttpp::////wwwwww.m.micicrroossccooppyy--aannaallyyssiiss..ccoomm//bbrruukkeerrawfmebwineabrisn?acr=selectronCIRCLE NO. 29 OR ONLINE:

MICROSCOPY AND ANALYSIS NOVEMBER 201133WHAT'SNEWCIRCLENO. 30 ORONLINE: www.microscopy-analysis.comHybrid Light and Electron MicroscopeTopcon Positioning Systems (TPS), a globalleader in precision optical, GPS, and automa-tion systems for geodetic, engineering and con-struction applications, has introduced theAquila hybrid microscope to the North Ameri-can market.The microscope magnifies from 30??in opti-cal mode, to 50,000??as an SEM. This uniquehybrid design provides key advantages thatshould expand the use of SEM technology.Ray O'Connor, TPS president and CEO, said,"The Aquila hybrid scope puts the versatility ofan optical microscope and the power of anscanning electron microscope (SEM) into a sim-ple, portable, and affordable package." Thesimplicity of the Aquila, both in design andfunctionality "creates an instrument with virtu-ally no learning curve," he said. "With an arrayMini-SEMHoldersIn close co-operation with its preferreddevelopment partner Deben, Phenom-World has developed a Temperature Con-trolled Sample Holder to study vacuum-sensitive and vulnerable samples on itsPhenom G2 desktop SEMs. This active sample holder is designed tocontrol the temperature of the samplebetween -25°C and +50°C. With the use ofthe temperature controlled holder, thetemperature of the sample is manipu-lated, therefore the humidity around itcan be controlled. This enables imaging ofmoistures and water containing samplesas well as reducing the effect the electronbeam has on beam sensitive samples. Thisresults in an extended viewing time, with-out noticeable vacuum artifacts. Theholder can be retrofitted to all versions ofthe Phenom G2 system.The improved Fibermetric applicationallows measurements and analysis oncomplicated fiber structures, ranging fromspunbond and electrospun fibers to themelt blown type of fibers. Fibermetric pro-vides accurate size information from microand nano fiber samples. Through furtherautomization of several important fea-tures, the Fibermetric has become evenmore user-friendly and guarantees a fastreturn on investment. The automated fea-tures that have the most effect on this arethe high number of measurements (max.1000 per image), the automated featureand fiber size detection, and the analysisof the data points.Contact: Phenom-World BV www.phenom-world.comof features that make it attractive to both theexperienced and new SEM user, it is the mostversatile and easy-to-use microscope on themarket.""Topcon has a long and respected history inthe optical market," O'Connor said. "Eventhough Aquila is not our typical positioninginstrument, it has incredible application oppor-tunities in several markets TPS already serves -mining, forensics, education, and water man-agement in particular." In addition to the areaspointed out by O'Connor, he noted the instru-ment has practical usage in air and water mon-itoring, metallurgy and metal analysis, materi-als analysis, food industry, quality control andmicro-mechanical systems. Contact: Topcon Positioning Systems, Inc.