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EBSD/EDSFREEWEBINARREGISTERTODAY!Advanced Phase ID Using Combined EBSD & EDS on SEM Date: 11 January 2012, 16.00 GMT, 17.00 CEST, 11.00 EDTDuration: 1 hourPresenters: Dr. Daniel Goran, EBSD Application Scientist Dr. Laurie Palasse, EBSD Application ScientistElectron backscatter diffraction (EBSD) and energy dispersive X-ray spectrometry (EDS) are common analytical methods used on the scanning electron microscope (SEM). They are complementary techniques and provide structural and compositional information respectively. Building on its recent developments in integrating EBSD and EDS, Bruker is now releasing an advanced phase identification feature. This new method significantly increases efficiency when dealing with multiphase materials and allows experts as well as less experienced users to acquire the best quality results.The webinar will focus on describing the new phase identifi cation procedure and its advantages compared to the common phase identifi cation method.Our experts will present numerous materials and earth science application examples.Who should attend? Researchers working in electron microscopy labs studying crystalline materials Materials and earth science lecturers and students EBSD users interested in advanced applications of the with IntegrityVolcanic rock - phase mapeEBSD Detector -Flash HR+CIRCLE NO. 28 OR ONLINE:

The Dimension FastScan AFM: SEM like user experience, True 3D nanometrology, and quantitative material property mapping in ambient, fl uid, and controlled environmentsInnovation with IntegrityAtomic Force MicroscopyIn many applications Atomic Force Microscopy (AFM) can provide unique and preferred sample information, however its slow speed and high complexity have often offset these benefi ts in favor of Electron Microscopy. The latest generation of Bruker's AFM, the Dimension FastScanT, enables nanometer resolution imaging, in a fraction of a minute, on a large-sample, fully automatable stage. The included ScanAsystT algorithm provides robust, intuitive, self-optimizing work-fl ow based operation. Combined these two capabilities create a highly productive nano-imaging solution akin to current Scanning Electron Microscopes (SEM).While both techniques provide surface imaging on the nano scale, the insights gained from each technique are also complimentary:. AFM can be performed, at nm-resolution, in ambient and fl uid environments, and typically requires no alterations of the sample surface chemistry prior to imaging. This enables non-destructive sample prep, convenient (multi-) sample loading, easy sample access, and imaging of dynamic sample changes over time.. AFM provides true nano-metrological information in all three sample dimensions. While SEM techniques can provide contrast based on elemental analysis, the latest-generation AFM mode, Bruker's proprietary PeakForce-QNM, provides quantitative nanoscale mapping of surface mechanical properties, such as modulus, adhesion, or dissipation, in addition to the standard topographical informationPlease join us for this focused review of the recent advances of the "other" nanoscale surface imaging technology.DATE: December 7th 4 pm BST, 5 pm CET, 11:00 am EDTPresenting: Dr. Johannes KindtFREEWEBINARREGISTERTODAY!To register for this webinar and for further information, please go to: hhttttpp::////wwwwww.m.micicrroossccooppyy--aannaallyyssiiss..ccoomm//bbrruukkeerrawfmebwineabrisn?acr=selectronCIRCLE NO. 29 OR ONLINE: