page 1
page 2
page 3
page 4
page 5
page 6
page 7
page 8
page 9
page 10
page 11
page 12
page 13
page 14
page 15
page 16
page 17
page 18
page 19
page 20
page 21
page 22
page 23
page 24
page 25
page 26
page 27
page 28
page 29
page 30
page 31
page 32
page 33
page 34
page 35
page 36
page 37
page 38
page 39
page 40
page 41
page 42
page 43
page 44

EBSD/EDSFREEWEBINARREGISTERTODAY!Advanced Phase ID Using Combined EBSD & EDS on SEM Date: 11 January 2012, 16.00 GMT, 17.00 CEST, 11.00 EDTDuration: 1 hourPresenters: Dr. Daniel Goran, EBSD Application Scientist Dr. Laurie Palasse, EBSD Application ScientistElectron backscatter diffraction (EBSD) and energy dispersive X-ray spectrometry (EDS) are common analytical methods used on the scanning electron microscope (SEM). They are complementary techniques and provide structural and compositional information respectively. Building on its recent developments in integrating EBSD and EDS, Bruker is now releasing an advanced phase identification feature. This new method significantly increases efficiency when dealing with multiphase materials and allows experts as well as less experienced users to acquire the best quality results.The webinar will focus on describing the new phase identifi cation procedure and its advantages compared to the common phase identifi cation method.Our experts will present numerous materials and earth science application examples.Who should attend? Researchers working in electron microscopy labs studying crystalline materials Materials and earth science lecturers and students EBSD users interested in advanced applications of the methodwww.microscopy-analysis.com/brukerwebinarsInnovation with IntegrityVolcanic rock - phase mapeEBSD Detector -Flash HR+CIRCLE NO. 28 OR ONLINE: www.microscopy-analysis.com

The Dimension FastScan AFM: SEM like user experience, True 3D nanometrology, and quantitative material property mapping in ambient, fl uid, and controlled environmentsInnovation with IntegrityAtomic Force MicroscopyIn many applications Atomic Force Microscopy (AFM) can provide unique and preferred sample information, however its slow speed and high complexity have often offset these benefi ts in favor of Electron Microscopy. The latest generation of Bruker's AFM, the Dimension FastScanT, enables nanometer resolution imaging, in a fraction of a minute, on a large-sample, fully automatable stage. The included ScanAsystT algorithm provides robust, intuitive, self-optimizing work-fl ow based operation. Combined these two capabilities create a highly productive nano-imaging solution akin to current Scanning Electron Microscopes (SEM).While both techniques provide surface imaging on the nano scale, the insights gained from each technique are also complimentary:. AFM can be performed, at nm-resolution, in ambient and fl uid environments, and typically requires no alterations of the sample surface chemistry prior to imaging. This enables non-destructive sample prep, convenient (multi-) sample loading, easy sample access, and imaging of dynamic sample changes over time.. AFM provides true nano-metrological information in all three sample dimensions. While SEM techniques can provide contrast based on elemental analysis, the latest-generation AFM mode, Bruker's proprietary PeakForce-QNM, provides quantitative nanoscale mapping of surface mechanical properties, such as modulus, adhesion, or dissipation, in addition to the standard topographical informationPlease join us for this focused review of the recent advances of the "other" nanoscale surface imaging technology.DATE: December 7th 4 pm BST, 5 pm CET, 11:00 am EDTPresenting: Dr. Johannes KindtFREEWEBINARREGISTERTODAY!To register for this webinar and for further information, please go to: hhttttpp::////wwwwww.m.micicrroossccooppyy--aannaallyyssiiss..ccoomm//bbrruukkeerrawfmebwineabrisn?acr=selectronCIRCLE NO. 29 OR ONLINE: www.microscopy-analysis.com