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MICROSCOPY AND ANALYSIS 30NOVEMBER 2011Quantitative CathodoluminescenceAttolight AG debuted the first-ever quantitativecathodoluminescence microscope featuringnanoscale resolution and picosecond timing in aneasy-to-use platform at the recent M&M meeting inNashville, TN."This is really the beginning of a whole new revo-lution in cathodoluminescence," said Attolight CEO,Dr Samuel Sonderegger. "There is no need to com-promise with this system: we run the full spectrumfrom UV to IR while maintaining 10 nm spatial reso-lution, and the full temperature range from 15K to300K, all with 100??larger field of view and up to100??more collection efficiency than any prior CLtechnology. Scientists can now have nanoscale imag-ing and pico-second time resolved spectroscopy, all inone instrument, with no compromises." At the heart of the Attolight CL line is a newlydesigned scanning electron microscope (SEM) con-taining an embedded optical microscope, a 9-axis cryonano-stage, and a fully integrated (not merely inter-faced) cathodoluminescence system. Available in two versions, the continuous wave CL10-Infinity can be field-upgraded to the picosecond,time-resolved CL10-10. The specifications are: spatial resolution: 10 nmacross the full spectrum; spectral range: UV to IR; fieldof view: 300 ?m; optical NA of 0.78 with 100??the col-lection efficiency; positioning: 9-axis cryo stage withpivot point lock; pulsed operation: picosecond speedwith no electron dispersion; drift and vibration: min-imized; beam blanking: proprietary laser driven, psphotoelectron gun; no compromise in spatial (10 nm)or temporal (ps) resolution across the spectrum fromUV to IR; thermal range: 20K to 300K.Contact: Attolight AG www.attolight.comPlasma FIB-FESEM WorkstationTESCAN, a world leading manufacturer of scanningelectron microscopes and focused ion beam worksta-tions has introduced the FERA3 XMH - a high-resolu-tion Schottky field-emission scanning electron micro-scope with a fully entegrated plasma source focusedion beam. The system has been developed in co-oper-ation with the French company Orsay Physics. In addition to electron and ion columns, the FERA3XMH Plasma FIB-FESEM can be configured with gasinjection systems, nanomanipulators, and a wide vari-ety of detectors including SE detector, BSE detector, SI(secondary ion) detector, CL (cathodoluminescence)detector, EDX and EBSD microanalyzers, etc. The use of a xenon plasma source for the focusedion beam allows the FERA3 to satisfy high-resolutionFIB requirements (imaging, fine milling/polishing), aswell as achieving high ion currents needed for ultra-fast material removal rates. The resolution of theplasma ion beam is <100 nm and the maximum Xe ioncurrent is >1 ?A. Compared to existing FIB technolo-gies with gallium sources, the material removal rateachievable for silicon with the PFIB (plasma FIB) is over30x faster. For this reason the FERA 3 XMH is wellsuited for applications requiring the removal of largevolumes of material, particularly in the semiconduc-tor packaging corridor where TSV technology is beingutilized.TESCAN will deliver the first system to the MiQroInnovation Collaborative Centre (C2MI) in Canada thisyear. The system will be used for the inspection ofintegrated circuit (IC) packaging.The FERA 3 FIB-SEM workstation's integration ofboth an electron and a focused ion beam places thistool in a class all its own, affording the end user thebenefits of electron beam analysis and characteriza-tion. Generally, systems of this kind will be used forcircuit editing, 3D metrology, defect analysis and fail-ure analysis.Contact: TESCAN www.tescan.comThermo Fisher Scientific has announced that its newThermo Scientific STP 420ES Tissue Processor for high-throughput tissue processing has been independentlyvalidated for xylene-free protocols. Scientists at the UK'sNewcastle upon Tyne Hospitals NHS Foundation Trustconfirmed the successful application of a standardxylene-free protocol on the STP 420ES. The tissue proces-sor delivered quality results using existing protocols, withthe exception of the requirement for a lower tempera-ture of 65°C, not 85°C, for the initial wax step. Elimination of xylene from tissue processing can cut costs, save time and improve the laboratory environment.Using isopropyl alcohol (IPA) as an alternative wax miscible dehydrant removes the risks of cumulative exposureand the high disposal costs associated with xylene, which is a hazardous chemical. Using IPA also shortens cycletimes and enables leaner workflows so laboratories can deliver patient results faster. Contact: Thermo Fisher Scientific www.thermoscientific.com/pathologyXylene-Free Tissue ProcessorCIRCLENO. 27 ORONLINE: www.microscopy-analysis.com

EBSD/EDSFREEWEBINARREGISTERTODAY!Advanced Phase ID Using Combined EBSD & EDS on SEM Date: 11 January 2012, 16.00 GMT, 17.00 CEST, 11.00 EDTDuration: 1 hourPresenters: Dr. Daniel Goran, EBSD Application Scientist Dr. Laurie Palasse, EBSD Application ScientistElectron backscatter diffraction (EBSD) and energy dispersive X-ray spectrometry (EDS) are common analytical methods used on the scanning electron microscope (SEM). They are complementary techniques and provide structural and compositional information respectively. Building on its recent developments in integrating EBSD and EDS, Bruker is now releasing an advanced phase identification feature. This new method significantly increases efficiency when dealing with multiphase materials and allows experts as well as less experienced users to acquire the best quality results.The webinar will focus on describing the new phase identifi cation procedure and its advantages compared to the common phase identifi cation method.Our experts will present numerous materials and earth science application examples.Who should attend? Researchers working in electron microscopy labs studying crystalline materials Materials and earth science lecturers and students EBSD users interested in advanced applications of the methodwww.microscopy-analysis.com/brukerwebinarsInnovation with IntegrityVolcanic rock - phase mapeEBSD Detector -Flash HR+CIRCLE NO. 28 OR ONLINE: www.microscopy-analysis.com