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Free Educational Webinar: Sample Preparation for Scanning Electron Microscopy (SEM) State of the art Critical Point Drying with the New fully automated Leica EM CPD300Speaker: Dr. Ruwin Pandithage, Leica Mikrosysteme GmbH, Vienna, AustriaOnline Seminar/Webinar on Sample Preparation for SEM Register at http://www.microscopy-analysis.com/leicawebinars and join on Tuesday 25th October 2011 at 17:00 h (CET), 16:00 h (UK) Watch this webinar if you are responsible for . EM sample preparation of delicate biological specimens such as pollen, tissue, plants or insects. EM sample preparation of industrial samples for MEMS (Micro Electro Mechanical Systems) applications Specimens that can be damaged due to surface tension when changing from the liquid to gaseous state, need special treatment during sample preparation. Critical point drying is an efficient method for drying such delicate samples for SEM applications because it preserves the surface structure. Before drying, many biological samples are additionally prepared through fixation and dehydration and then coated after drying with a metal such as gold, platinum or palladium to make their surfaces electrically conductive for the SEM analysis. If the surface structure is altered during the drying process the results of the following SEM application will provide incorrect results.In the past, critical point drying was a time consuming process with low sample reproducibility due to manual operation.This webinar will show you how the New Leica EM CPD300 dries delicate biological or industrial samples in a fully automated and controlled process to preserve your samples for subsequent treatment and analysis.Register at http://www.microscopy-analysis.com/leicawebinarsThis webinar is available on demand under the above registration link.Critical Point Drying with Leica EM CPD300Free Educational Webinar: Sample Preparation for Scanning Electron Microscopy (SEM) State of the art Critical Point Drying with the New fully automated Leica EM CPD300Speaker: Dr. Ruwin Pandithage, Leica Mikrosysteme GmbH, Vienna, AustriaOnline Seminar/Webinar on Sample Preparation for SEM Register at http://www.microscopy-analysis.com/leicawebinars and join on Tuesday 25th October 2011 at 17:00 h (CET), 16:00 h (UK) Watch this webinar if you are responsible for . EM sample preparation of delicate biological specimens such as pollen, tissue, plants or insects. EM sample preparation of industrial samples for MEMS (Micro Electro Mechanical Systems) applications Specimens that can be damaged due to surface tension when changing from the liquid to gaseous state, need special treatment during sample preparation. Critical point drying is an efficient method for drying such delicate samples for SEM applications because it preserves the surface structure. Before drying, many biological samples are additionally prepared through fixation and dehydration and then coated after drying with a metal such as gold, platinum or palladium to make their surfaces electrically conductive for the SEM analysis. If the surface structure is altered during the drying process the results of the following SEM application will provide incorrect results.In the past, critical point drying was a time consuming process with low sample reproducibility due to manual operation.This webinar will show you how the New Leica EM CPD300 dries delicate biological or industrial samples in a fully automated and controlled process to preserve your samples for subsequent treatment and analysis.Register at http://www.microscopy-analysis.com/leicawebinarsThis webinar is available on demand under the above registration link.Critical Point Drying with Leica EM CPD300Online Seminar/Webinar on Sample Preparation for SEMRegister at http://www.microscopy-analysis.com/leicawebinarsCIRCLE NO. 25 OR ONLINE: www.microscopy-analysis.com

Discover how to make every electron count at fei.com/chemistem.Introducing the newest member of the Titan family: TitanT G2 80-200 with ChemiSTEMT Technology. Combining FEI's groundbreaking ChemiSTEM Technology with Titan's market-leading sub-atomic resolution imaging, Titan G2 80-200 offers highly sensitive, fast elemental mapping, superior ultra-low concentration detection and the highest analytical probe current available. Even EDX tomography is easily achieved with stunning results.Make Every Electron Count ChemiSTEMTM TechnologyGaAs Atomic EDX showing 1.4 Angstroms dumbbells with Titan G2 80-200 with ChemiSTEM TechnologySample courtesy of Ionela Vrejoiu and Eckhard Pippel, Max Planck Institute of Microstructure Physics, Halle/Saale, Germany.La1-xSrxMnO3/SrRuO3 multilayer/quantum well systems in [100] projectionCIRCLE NO. 26 OR ONLINE: www.microscopy-analysis.com